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| I Can Statements | Academic Vocabulary |
|---|---|
| I can qualitatively describe how changing the voltage or resistance of a simple series (i.e. loop) circuit affects the voltage measurements of individual resistive devices and for the entire circuit.
I can qualitatively describe how changing the voltage or resistance of a simple series (i.e. loop) circuit affects the current measurements of individual resistive devices and for the entire circuit. I can qualitatively describe how changing the voltage or resistance of a simple series (i.e. loop) circuit affects the power measurements of individual resistive devices and for the entire circuit. I can quantitatively describe how changing the voltage or resistance of a simple series (i.e. loop) circuit affects the voltage measurements of individual resistive devices and for the entire circuit. I can quantitatively describe how changing the voltage or resistance of a simple series (i.e. loop) circuit affects the current measurements of individual resistive devices and for the entire circuit. I can quantitatively describe how changing the voltage or resistance of a simple series (i.e. loop) circuit affects the power measurements of individual resistive devices and for the entire circuit. |
Voltage |
| Cross Cutting Concepts |
|---|
| Cause & Effect *Empirical evidence is required to differentiate between cause and correlation and make claims about specific causes and effects. Cause & Effect Scale, Proportion, and Quantity |
| Science and Engineering Process Standards |
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| SEPS 2: Developing and Using Models
SEPS 5: Using Mathematics and Computational Thinking SEPS 6: Constructing Explanations and Designing Solutions |
| Looking Back | Looking Ahead |
|---|---|
| Describe the slope of the graphical representation of current vs. voltage or voltage vs. current in terms of the resistance of the device. (PI.8.4) | Qualitatively and quantitatively describe how changing the voltage or resistance of a simple parallel (i.e. ladder) circuit affects the voltage, current, and power measurements of individual resistive devices and for the entire circuit. (PI.8.6) |